2194
Investigation of the Current Stability of AlGaN/GaN High Electron Mobility Transistors in Various Liquid/Solid Interface on the Gate Area
Investigation of the Current Stability of AlGaN/GaN High Electron Mobility Transistors in Various Liquid/Solid Interface on the Gate Area
Monday, October 28, 2013: 09:20
Golden Gate 7, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Abstract:
- E11-2194 (123.7KB) - Abstract Text