1901
Key Reliability Issues for SiC Power MOSFETs

Monday, October 28, 2013: 11:20
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
A. Lelis , U.S. Army Research Laboratory, Adelphia, MD
D. Habersat , U.S. Army Research Laboratory
R. Green , U.S. Army Research Laboratory
E. Mooro , U.S. Army Research Laboratory

Abstract:

See more of: SiC MOS Power Devices
See more of: E3: GaN and SiC Power Technologies 3
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
<< Previous Abstract | Next Abstract >>