GaN Power Devices 1

Tuesday, October 29, 2013: 08:00-10:00
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Chairs:
Kenneth A. Jones and Ibrahim Abdel-Motaleb, PhD
08:00
III-Nitride Materials and Devices for Power Electronics
Alex Dobrinsky, PhD, Sensor Electronic Technology, Inc.; Grigory Simin, University of South Carolina; Remis Gaska, Sensor Electronic Technology, Inc.; Michael Shur, Rensselaer Polytechnic Institute
08:20
Normally-Off GaN Transistors for Power Switching Applications
Oliver Hilt, Leibniz-Institut fuer Hoechstfrequenztechnik; Eldad Bahat-Treidel, Leibniz-Institut fuer Hoechstfrequenztechnik; Frank Brunner, Leibniz-Institut fuer Hoechstfrequenztechnik; Arne Knauer, Leibniz-Institut fuer Hoechstfrequenztechnik; Rimma Zhytnytska, Leibniz-Institut fuer Hoechstfrequenztechnik; Przemyslaw Kotara, Leibniz-Institut fuer Hoechstfrequenztechnik; Joachim Wuerfl, Leibniz-Institut fuer Hoechstfrequenztechnik
08:40
High Performance Normally-off GaN MOSFETs on Si Substrates
Hiroshi Kambayashi, Ph. D, Furukawa Electric Co., Ltd.; Nariaki Ikeda, Furukawa Electric Co., Ltd.; Takehiko Nomura, Furukawa Electric Co., Ltd.; Hirokazu Ueda, Tokyo Electron Ltd.; Y. Morozumi, Tokyo Electron Ltd.; Katsushige Harada, Tokyo Electron Tohoku Ltd.; Kazuhide Hasebe, Tokyo Electron Tohoku Ltd.; Akinobu Teramoto, Ph. D., Tohoku University; Shigetoshi Sugawa, Ph. D., Tohoku University; Tadahiro Ohmi, Ph. D., Tohoku University
09:00
Ultra-Thin Gate Dielectrics for Leakage Current Suppression in Vertically-Scaled GaN MIS-Hemts
David J. Meyer, U.S. Naval Research Laboratory; Brian P. Downey, U.S. Naval Research Laboratory; D. Scott Katzer, U.S. Naval Research Laboratory; Jason A. Roussos, U.S. Naval Research Laboratory; David F. Storm, U.S. Naval Research Laboratory; Mario G. Ancona, U.S. Naval Research Laboratory; Charles R. Eddy Jr., Naval Research Laboratory; Steven C. Binari, U.S. Naval Research Laboratory; Ming Pan, IQE RF LLC; Xiang Gao, IQE RF LLC
09:20
Characterization and Performance of D-Mode GaN HEMT Transistor Used in a Cascode Configuration
Tom MacElwee, BASc EE, GaN Systems Inc.; John Roberts, BASc EE, M.Sc.A, GaN Systems Inc.; Hugues Lafontaine, B. Eng M.Sc.A. Ph.D., GaN Systems Inc.; I. Scott, GaN Systems Inc.; Greg Klowak, BASc EE, M.Sc.A, GaN Systems Inc.; Lyubov Yushyna, Ph.D., GaN Systems Inc.
09:40
Voltage Switching Limits of Lateral GaN Power Devices
Krishna Shenai, Argonne National Laboratory