Plenary Session

Monday, October 28, 2013: 08:00-10:00
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Chairs:
Krishna Shenai and N. Ohtani
08:00
Welcoming Remarks
08:10
A Thermodynamic Interpretation of PVT Growth of Single Crystal SiC Material and Challenges in Reducing Dislocations
Tatsuo Fujimoto, Ph.D., Nippon Steel & Sumitomo Metal Corporation; Masakazu Katsuno, Nippon Steel & Sumitomo Metal Corporation; Hiroshi Tsuge, Nippon Steel & Sumitomo Metal Corporation; Shinya Sato, Nippon Steel & Sumitomo Metal Corporation; Shohji Ushio, Nippon Steel & Sumitomo Metal Corporation; Komomo Tani, Nippon Steel & Sumitomo Metal Corporation; Hirokatsu Yashiro, Nippon Steel & Sumitomo Metal Corporation; Hohsei Hirano, Nippon Steel & Sumitomo Metal Corporation; Takayuki Yano, Nippon Steel & Sumitomo Metal Corporation
08:30
Unexpected Sources of Basal Plane Dislocations in 4H‑SiC Epitaxy
Robert E Stahlbush, Ph. D., Naval Research Laboratory; Nadeemullah A Mahadik, Ph. D., Naval Research Laboratory
08:50
Correlation between Defects and Electrical Characteristics/Reliability Analyzed by Integrated Evaluation Platform for SiC
Makoto Kitabatake, Doctor, R&D Partnership for Future Power Electronics Technology (FUPET)
09:10
Growth of High-Quality GaN Template from Nanometer-Size Lattice Channels by Hydride Vapor Phase Epitaxy
Akira Usui, Nitride Semiconductor Department, Furukawa Co., Ltd.; Hiroki Goto, Nitride Semiconductor Department, Furukawa Co., Ltd.; Toshiharu Matsueda, Nitride Semiconductor Department, Furukawa Co., Ltd.; Haruo Sunakawa, Nitride Semiconductor Department, Furukawa Co., Ltd.; Takuya Nakagawa, Nitride Semiconductor Department, Furukawa Co., Ltd.; Akiko Okada, Institute for Nanoscience and Nanotechnology, Waseda University; Jun Mizuno, Institute for Nanoscience and Nanotechnology, Waseda University; Atsushi A. Yamaguchi, Optoelectronic Device System R&D Center, Kanazawa Institute of Technology; Hidetoshi Shinohara, Nano Processing System Division, Toshiba Machine Co., Ltd.; Hiroshi Goto, Nano Processing System Division, Toshiba Machine Co., Ltd.
09:30
Packaging Techniques for Compact SiC Power Modules Operable in an Extended Tj Range
Satoshi Tanimoto, Nissan Motor Co., Ltd.; Kinuyo Watanabe, AIST; Hidekazu Tanisawa, Sanken Electric Co., Ltd.; Kohei Matsui, Fuji Electric Co., Ltd.; Shinji Sato, Sanken Electric Co., Ltd.
09:50
Break