1894
Correlation between Defects and Electrical Characteristics/Reliability Analyzed by Integrated Evaluation Platform for SiC

Monday, October 28, 2013: 08:50
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Makoto Kitabatake, Doctor , R&D Partnership for Future Power Electronics Technology (FUPET), Tsukuba, Japan

Abstract:

  • E3-1894 (1058.0KB) - Abstract Text
See more of: Plenary Session
See more of: E3: GaN and SiC Power Technologies 3
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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