D02 Poster Session

Wednesday, October 14, 2015: 18:00-20:00
West Hall 1 (Phoenix Convention Center)
Chair:
Shoso Shingubara
773
Characterization of Low-Dielectric Constant Silicon Carbonitride (SiCN) Dielectric Films for Charge Trapping Nonvolatile Memories
S. R. A. Ahmed, S. Naito (Tokai University), and K. Kobayashi (Tokai University)
774
Resistance Switching Phenomenon Associated with Anisotropic Magnetoresistance of  the ReRAM Device with Ferromagnetic Electrodes
D. Ito (Kansai Univ.), H. Yoshida (Kansai Univ.), T. Shimizu (Kansai University), and S. Shingubara (Kansai University)
See more of: D02: Nonvolatile Memories
See more of: Dielectric Science and Materials
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