Device Modeling

Tuesday, 3 October 2017: 15:40-17:00
National Harbor 4 (Gaylord National Resort and Convention Center)
Phase-Field Modeling of the Thermal Growth of an Oxide Film and the Electrochemical Performance of a Solid Oxide Fuel Cell: Similarities and Differences
T. L. Cheng (U.S. Department of Energy - NETL, AECOM, P.O. Box 1959, Albany, OR, 97321, USA), Y. H. Wen (U.S. Department of Energy - NETL), and J. A. Hawk (DOE/ NETL)
Theoretical Investigation of Vanadium Crossover Phenomena through Different Types of Membrane in Vanadium Redox Flow Battery
D. Jeong (Chonnam national university) and S. Jung (Chonnam National University)