Non-silicon Material Cleaning and Conditioning
	 
					
	
	Wednesday, October 30, 2013: 08:10-11:00
	Continental 8, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
	
	
	
	
	
		
			Chairs:
			
				
					
					
						Paul W. Mertens
					
				
					 and 
					
						Jeongwon PARK
					
				
			
 
		 
	
	
	
	
	
	
	
	
	
		
			10:00
		
	
	
	
		
			
				Study of InP Surfaces after Wet Chemical Treatments
			
			
				
					
						Daniel Cuypers, KULeuven; 
					
						Dennis H. van Dorp, imec, Belgium; 
					
						Massimo Tallarida, Brandenburg University of Technology Cottbus; 
					
						Simone Brizzi, Brandenburg University of Technology Cottbus; 
					
						Leonard Rodriguez, Imec; 
					
						Thierry Conard, IMEC; 
					
						Sophia Arnauts, Imec; 
					
						Dieter Schmeisser, Brandenburg University of Technology Cottbus; 
					
						Christoph Adelmann, Imec; 
					
						Stefan De Gendt, KULeuven
					
				
			
			
				
			
		
	 
 
	
	
		
			10:20
		
	
	
	
		
			
				Selective Ni Removal Deposited on Ge at Different Annealing Temperatures
			
			
				
					
						Masayuki Otsuji, master, Dainippon screen; 
					
						Y. Yoshida, Dainippon Screen Mfg. Co., Ltd.; 
					
						H. Takahashi, Dainippon Screen Mfg. Co., Ltd.; 
					
						J. Snow, Dainippon Screen Mfg. Co., Ltd.; 
					
						F. Sebaai, imec; 
					
						Paul W. Mertens, imec; 
					
						M. Sato, Dainippon Screen Mfg. Co., Ltd.; 
					
						H. Shirakawa, Dainippon Screen Mfg. Co., Ltd.; 
					
						H. Uchida, Dainippon Screen Mfg. Co., Ltd.
					
				
			
			
				
			
		
	 
 
	
	
	
		
			 
		
	
	
		
			
		
	
	
		
			Surface Preparation of Si and Ge Wafers Using Functional Water (Cancelled)