Non-silicon Material Cleaning and Conditioning
Wednesday, October 30, 2013: 08:10-11:00
Continental 8, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Chairs:
Paul W. Mertens
and
Jeongwon PARK
10:00
Study of InP Surfaces after Wet Chemical Treatments
Daniel Cuypers, KULeuven;
Dennis H. van Dorp, imec, Belgium;
Massimo Tallarida, Brandenburg University of Technology Cottbus;
Simone Brizzi, Brandenburg University of Technology Cottbus;
Leonard Rodriguez, Imec;
Thierry Conard, IMEC;
Sophia Arnauts, Imec;
Dieter Schmeisser, Brandenburg University of Technology Cottbus;
Christoph Adelmann, Imec;
Stefan De Gendt, KULeuven
10:20
Selective Ni Removal Deposited on Ge at Different Annealing Temperatures
Masayuki Otsuji, master, Dainippon screen;
Y. Yoshida, Dainippon Screen Mfg. Co., Ltd.;
H. Takahashi, Dainippon Screen Mfg. Co., Ltd.;
J. Snow, Dainippon Screen Mfg. Co., Ltd.;
F. Sebaai, imec;
Paul W. Mertens, imec;
M. Sato, Dainippon Screen Mfg. Co., Ltd.;
H. Shirakawa, Dainippon Screen Mfg. Co., Ltd.;
H. Uchida, Dainippon Screen Mfg. Co., Ltd.
Surface Preparation of Si and Ge Wafers Using Functional Water (Cancelled)