Surfaces & Interfaces 1: Characterization and Process Control

Monday, 6 October 2014: 13:40-15:40
Expo Center, 1st Floor, Universal 7 (Moon Palace Resort)
Seiichi Miyazaki and Shigeaki Zaima
Detection of Ge and Si Intermixing in Ge/Si Using Multiwavelength Micro-Raman Spectroscopy
W. S. Yoo, K. Kang, T. Ueda, T. Ishigaki (WaferMasters, Inc.), H. Nishigaki, N. Hasuike, H. Harima, M. Yoshimoto (Kyoto Institute of Technology), and C. S. Tan (Nanyang Technological University)
(Invited) Si Ultrathin Films on Silver Surfaces: An Intriguing Epitaxial System
T. Leoni (Aix Marseille Université), R. Bernard (Institut des Nanosciences de Paris), A. Ranguis (Aix Marseille Université), Y. Borensztein, G. Prévot (Institut des Nanosciences de Paris), and L. Masson (Aix Marseille Université)
Ni(SiGeSn) Metal Contact Formation on Low Bandgap Strained (Si)Ge(Sn) Semiconductors
S. Wirths (Forschungszentrum Juelich), R. Troitsch (Peter Grünberg Institute 9 and JARA-FIT), G. Mussler (Forschungszentrum Juelich), P. Zaumseil (IHP), J. M. Hartmann (Université Grenoble Alpes), T. Schroeder (IHP), S. Mantl, and D. Buca (Forschungszentrum Juelich)