Poster Session

Wednesday, October 30, 2013: 18:00-20:00
Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
Chairs:
S. De Gendt and O. van der Straten
Diaphragm Durability Enhancement for Valves Supplying Gas for Atomic Layer Deposition
Michio Yamaji, Tohoku University; Tsuyoshi Tanikawa, Fujikin Incorporated; Tadayuki Yakushijin, Fujikin Incorporated; Takashi Funakoshi, Fujikin Incorporated; Satoru Yamashita, Fujikin Incorporated; Atsushi Hidaka, Fujikin Incorporated; Masaaki Nagase, Fujikin Incorporated; Nobukazu Ikeda, Fujikin Incorporated; Shigetoshi Sugawa, Ph. D., Tohoku University; Tadahiro Ohmi, Ph. D., Tohoku University
ZnO Nanorods Grown On ZnO Seed Layer Derived By Atomic Layer Deposition Process
Kai Zhang, Old Dominion University; Sushil Khadka, Old Dominion University; David Nminibapiel, Old Dominion University; Madhavi Tangirala, Old Dominion University; Helmut Baumgart, Old Dominion University
VO2 Films Prepared by Atomic Layer Deposition and RF Magnetron Sputtering 
Madhavi Tangirala, Newport News; Kai Zhang, Newport News; David Nminibapiel, Newport News; Venkateswara Pallem, Delaware Research & Technology Center; Christian Dussarrat, Delaware Research & Technology Center; Wei Cao, Newport News; Thomas N Adam, PhD, University at Albany; Corbet S Johnson, B.Sc., University at Albany; Hani Elsayed-Ali, Newport News; Helmut Baumgart, Newport News
Nanoscale Film Thickness Measurements By X-Ray Fluorescence Spectroscopy for ALD Grown Films
Tarek M Abdel-Fattah, Christopher Newport University; Helmut Baumgart, Old Dominion University
Microstructure Analysis of ALD Bi2Te3/Sb2Te3 Thermoelectric Nanolaminates
David Nminibapiel, Applied Research Center at Thomas Jefferson National Accelerator Laboratories; Kai Zhang, Applied Research Center at Thomas Jefferson National Accelerator Laboratories; Madhavi Tangirala, Applied Research Center at Thomas Jefferson National Accelerator Laboratories; Helmut Baumgart, Applied Research Center at Thomas Jefferson National Accelerator Laboratories; Venkata S Chakravadhanula, Karlsruhe Institute of Technology; Christian Kübel, Karlsruhe Institute of Technology; Vladimir Kochergin, MicroXact Inc.
Ultra Dielectrophoresis Using Atomic Layer Deposited Films: Electrothermal Analysis
Sam Emaminejad, Stanford Genome Technology Center; Mehdi Javanmard, Stanford Genome Technology Center; Robert W. Dutton, Stanford University; Ronald W. Davis, Stanford Genome Technology Center
Physical, Electrical, and Reliability Characteristics of Multi-Step Deposition-Annealed HfO2 Film
Yi-Lung Cheng, National Chi-Nan University; Cheng-Yang Hsieh, Master, National Chi-Nan University; Tian-Cih Bo, Master, National Chi-Nan University; Chang-Sian Wu, National Chi-Nan University; Jian-Run Lin, National Chi-Nan University