Tuesday, 7 October 2014: 13:40-16:20
Expo Center, 1st Floor, Universal 5 (Moon Palace Resort)
Chairs:
M. Engelhardt
and
Dennis W. Hess
14:00
Plasma Etch in the Era of Atomic Scale Fidelity
T. Lill, H. Singh, G. Kamarthy, K. J. Kanarik, A. Cohen, A. Eppler, J. Holland, A. Fischer, M. Shen, J. Marks, R. A. Gottscho, and V. Vahedi (Lam Research)
16:00
HfO2 Gate Stack Engineering by Post-Gate Cleaning Using NF3/NH3 Plasma
M. S. Lee (Department of Materials Science and Engineering, Yonsei University), H. J. Oh (BIO-IT Micro Fab Center, Yonsei University), J. H. Lee, I. G. Lee (Department of Materials Science and Engineering, Yonsei University), W. G. Shin, S. Y. Kang (Gen Co. Ltd., Korea), and D. H. Ko (Department of Materials Science and Engineering, Yonsei University)